ANYAORA , S. C.; NWOKEOCHA, T. O.; NWAOKAFOR, I. C. C.-.; TAKIM , S. A. I-V Characterization and Electrical Performance Analysis of Undoped, N-Type, and P-Type Silicon for Semiconductor Applications. Journal of Computer Science and Research (JoCoSiR), [S. l.], v. 2, n. 4, p. 1–9, 2025. DOI: 10.65126/jocosir.v3i1.47. Disponível em: https://journal.aptikomsumut.org/index.php/jocosir/article/view/47. Acesso em: 20 apr. 2026.